Perception-Driven Soft-Edge Occlusion for Optical See-Through Head-Mounted Displays
Xiaodan Hu, Yan Zhang, Alexander Plopski, Yuta Itoh, Monica Perusquía-Hernández, Naoya Isoyama, Hideaki Uchiyama, and Kiyoshi Kiyokawa
Xiaodan Hu, Yan Zhang, Alexander Plopski, Yuta Itoh, Monica Perusquía-Hernández, Naoya Isoyama, Hideaki Uchiyama, and Kiyoshi Kiyokawa
Guanghan Zhao, Xiaodan Hu, Jason Orlosky, and Kiyoshi Kiyokawa
Yan Zhang, Keyao You, Xiaodan Hu, Hangyu Zhou, Kiyoshi Kiyokawa, and Xubo Yang
Xiaodan Hu, Yan Zhang, Hideaki Uchiyama, Naoya Isoyama, Nobuchika Sakata, and Kiyoshi Kiyokawa
Yan Zhang, Xiaodan Hu, Kiyoshi Kiyokawa, and Xubo Yang
Yan Zhang, Xiaodan Hu, Kiyoshi Kiyokawa, Naoya Isoyama, Hideaki Uchiyama, and Hong Hua
Yan Zhang, Xiaodan Hu, Kiyoshi Kiyokawa, Naoya Isoyama, Nobuchika Sakata, and Hong Hua
Conference proceedings talk at Testing Institute of America 2014 Annual Conference, Los Angeles, CA, USA
Talk at London School of Testing, London, UK
Tutorial at UC-Berkeley Institute for Testing Science, Berkeley, CA, USA
Talk at UC San Francisco, Department of Testing, San Francisco, CA, USA